Chaoying Ni
University of Delaware, USA
Biography
Chaoying Ni centers his research interest on the structural and property characterizations of advanced materials using Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM). His expertise includes electron crystallography and e-beam associated spectroscopy. His active efforts are on the process-structure-property relationships of advanced composites, materials for energy or environment, mechanistic interpretation of thermal properties, mesoporous crystals, functionalized nanostructures and assemblies, thin films, interfaces and coherence growths.
Abstract
Abstract : Structural and thermal properties of reaction bonded SiC/Si composite
